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Journal description
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Details for article 47 of 98 found articles
| Title: |
Investigation and improvement of single-event burn-out in 4H-SiC trench insulated gate bipolar transistors |
| Author: |
Liu, Yan-juan Wang, Ying Wang, Yu-peng Wang, Le-ning |
| Appeared in: |
Results in physics |
| Paging: | Volume 29 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 47 of 98 found articles
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