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Journal description
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Details for article 31 of 106 found articles
| Title: |
Electromigration failure mechanisms of 〈111〉 -oriented nanotwinned Cu redistribution lines with polyimide capping |
| Author: |
Tseng, I-Hsin Hsu, Po-Ning Lu, Tien-Lin Tu, K.N. Chen, Chih |
| Appeared in: |
Results in physics |
| Paging: | Volume 24 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 31 of 106 found articles
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