|
Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors |
|
|
|
Titel: |
Study of dark current random telegraph signal in proton-irradiated backside illuminated CMOS image sensors |
Auteur: |
Liu, Bingkai Li, Yudong Wen, Lin Zhou, Dong Feng, Jie Zhang, Xiang Cai, Yulong Fu, Jing Chen, Jiawei Guo, Qi |
Verschenen in: |
Results in physics |
Paginering: |
Jaargang 19 () nr. C pagina's p. |
Jaar: |
2020 |
Inhoud: |
|
Uitgever: |
The Authors |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|