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                                       Details for article 91 of 208 found articles
 
 
  Impact of high-k gate dielectric with different angles of coverage on the electrical characteristics of gate-all-around field effect transistor: A simulation study
 
 
Title: Impact of high-k gate dielectric with different angles of coverage on the electrical characteristics of gate-all-around field effect transistor: A simulation study
Author: Karbalaei, Mohammad
Dideban, Daryoosh
Heidari, Hadi
Appeared in: Results in physics
Paging: Volume 16 () nr. C pages p.
Year: 2020
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 91 of 208 found articles
 
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