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                                       Details for article 20 of 237 found articles
 
 
  A study on effects of total ionizing dose on hot carrier effect of PD I/O SOI PMOSFETs
 
 
Title: A study on effects of total ionizing dose on hot carrier effect of PD I/O SOI PMOSFETs
Author: Zhao, Jinghao
Zheng, Qiwen
Cui, Jiangwei
Zhou, Hang
Liang, Xiaowen
Yu, Xuefeng
Guo, Qi
Appeared in: Results in physics
Paging: Volume 13 () nr. C pages p.
Year: 2019
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 20 of 237 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands