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  Reliability of R&D capitalization: Evidence from ex post impairment in China
 
 
Title: Reliability of R&D capitalization: Evidence from ex post impairment in China
Author: Yang, Yulong
Appeared in: China journal of accounting research
Paging: Volume 12 (2019) nr. 3 pages 251-269
Year: 2019
Contents:
Publisher: Sun Yat-sen University
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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