DNA Degradation Test Predicts Success in Whole-Genome Amplification from Diverse Clinical Samples
Titel:
DNA Degradation Test Predicts Success in Whole-Genome Amplification from Diverse Clinical Samples
Auteur:
Wang, Fengfei Wang, Lilin Briggs, Christine Sicinska, Ewa Gaston, Sandra M. Mamon, Harvey Kulke, Matthew H. Zamponi, Raffaella Loda, Massimo Maher, Elizabeth Ogino, Shuji Fuchs, Charles S. Li, Jin Hader, Carlos Makrigiorgos, G. Mike
Verschenen in:
The journal of molecular diagnostics
Paginering:
Jaargang 9 (2007) nr. 4 pagina's 11 p.
Jaar:
2007
Inhoud:
Uitgever:
American Society for Investigative Pathology and Association for Molecular Pathology