Electric Field–Induced Release and Measurement (EFIRM)
Titel:
Electric Field–Induced Release and Measurement (EFIRM)
Auteur:
Tu, Michael Cheng, Jordan Chen, Yi-Lin Jea, Wen-Chien Chen, Wan-Li Chen, Chien-Jung Ho, Chung-Liang Huang, Wei-Lun Lin, Chien-Chung Su, Wu-Chou Ye, Qianlin Deignan, Josh Grody, Wayne Li, Feng Chia, David Wei, Fang Liao, Wei Wong, David T.W. Strom, Charles M.
Verschenen in:
The journal of molecular diagnostics
Paginering:
Jaargang 22 () nr. 8 pagina's 1050-1062
Jaar:
2020
Inhoud:
Uitgever:
Association for Molecular Pathology and American Society for Investigative Pathology