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                                       Details for article 34 of 61 found articles
 
 
  Identification of wheat leaf diseases and their severity based on elliptical-maximum margin criterion metric learning
 
 
Title: Identification of wheat leaf diseases and their severity based on elliptical-maximum margin criterion metric learning
Author: Bao, Wenxia
Zhao, Jian
Hu, Gensheng
Zhang, Dongyan
Huang, Linsheng
Liang, Dong
Appeared in: Sustainable computing: informatics and systems
Paging: Volume 30 () nr. C pages p.
Year: 2021
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 34 of 61 found articles
 
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