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                                       Details for article 65 of 101 found articles
 
 
  New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection
 
 
Title: New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection
Author: Abo-elftooh, Bassam A.
El-Mahlawy, Mohamed H.
Ragai, Hani F.
Appeared in: Ain shams engineering journal
Paging: Volume 12 () nr. 2 pages 1701-1721
Year: 2021
Contents:
Publisher: THE AUTHORS
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 65 of 101 found articles
 
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