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In-Silico scrutinization of (Al, Ga, B, Si, Ge, and P)-doped C60 in sensing EGCG: An application based DFT study |
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Titel: |
In-Silico scrutinization of (Al, Ga, B, Si, Ge, and P)-doped C60 in sensing EGCG: An application based DFT study |
Auteur: |
Singh, Praval Pratap Dey, Chandraniv Dhal, Biswajit Muduli, S. Birupakshya Chakraborty, Sudip |
Verschenen in: |
Computational and theoretical chemistry |
Paginering: |
Jaargang 1244 () nr. C pagina's p. |
Jaar: |
2025 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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