An optimal defect recognition security-based terahertz low resolution image system using deep learning network
Titel:
An optimal defect recognition security-based terahertz low resolution image system using deep learning network
Auteur:
Danso, Samuel Akwasi Liping, Shang Hu, Deng Afoakwa, Samuel Badzongoly, Eugene Louis Odoom, Justice Muhammad, Owais Mushtaq, Muhammad Umer Qayoom, Abdul Zhou, Wenqing