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Journal description
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Details for article 54 of 176 found articles
| Title: |
Effects of total dose irradiation on the threshold voltage of H-gate SOI NMOS devices |
| Author: |
Wang, Qian-Qiong Liu, Hong-Xia Chen, Shu-Peng Wang, Shu-Long Fei, Chen-Xi Zhao, Dong-Dong |
| Appeared in: |
Nuclear science and techniques |
| Paging: | Volume 27 (2016) nr. 5 pages 1-7 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Springer Singapore, Singapore |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 54 of 176 found articles
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