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                                       Details for article 6 of 8 found articles
 
 
  Influences of atomic force microscopy probe on the electrical properties of rubrene crystal device
 
 
Title: Influences of atomic force microscopy probe on the electrical properties of rubrene crystal device
Author: ZHANG, Xu-Zhao
GAO, Shu-Jing
QU, Ying-Jie
WANG, Hai-Ting
Appeared in: Chinese journal of analytical chemistry
Paging: Volume 51 () nr. 4 pages p.
Year: 2023
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 8 found articles
 
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