|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 7 found articles
| Title: |
Influence of Edge Effect and X-Y Effect on Measurement Precision in Sensitive High Resolution Ion Microprobe IIe MC Oxygen Isotopes Analysis |
| Author: |
LONG, Tao SHI, Jian BAO, Ze-Min Clement, Stephen W.J. ZHANG, Yu-Hai TIAN, Di LIU, Dun-Yi |
| Appeared in: |
Chinese journal of analytical chemistry |
| Paging: | Volume 43 (2015) nr. 12 pages 7 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Changchun Institute of Applied Chemistry, Chinese Academy of Sciences |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 7 found articles
| << previous | next >> |