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Details for article 195 of 271 found articles
| Title: |
Secondary Electron Yield of Emissive Materials for Large-Area Micro-Channel Plate Detectors: Surface Composition and Film Thickness Dependencies |
| Author: |
Jokela, Slade J. Veryovkin, Igor V. Zinovev, Alexander V. Elam, Jeffrey W. Mane, Anil U. Peng, Qing Insepov, Z. |
| Appeared in: |
Physics procedia |
| Paging: | Volume 37 (2012) nr. C pages 8 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 195 of 271 found articles
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