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Journal description
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Details for article 17 of 30 found articles
| Title: |
Measuring knowledge exploration distance at the patent level: Application of network embedding and citation analysis |
| Author: |
Choi, Jaewoong Yoon, Janghyeok |
| Appeared in: |
Journal of informetrics |
| Paging: | Volume 16 () nr. 2 pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 30 found articles
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