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                                       Details for article 17 of 30 found articles
 
 
  Measuring knowledge exploration distance at the patent level: Application of network embedding and citation analysis
 
 
Title: Measuring knowledge exploration distance at the patent level: Application of network embedding and citation analysis
Author: Choi, Jaewoong
Yoon, Janghyeok
Appeared in: Journal of informetrics
Paging: Volume 16 () nr. 2 pages p.
Year: 2022
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 17 of 30 found articles
 
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