Digital Library
Close Browse articles from a journal
 
<< previous   
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 43 of 43 found articles
 
 
  X-ray determination of the residual stresses in thin aluminum films deposited on silicon substrates
 
 
Title: X-ray determination of the residual stresses in thin aluminum films deposited on silicon substrates
Author: Korhonen, M.A.
Paszkiet, Christine A.
Appeared in: Scripta metallurgica
Paging: Volume 23 (1989) nr. 8 pages 5 p.
Year: 1989
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 43 of 43 found articles
 
<< previous   
 
 Koninklijke Bibliotheek - National Library of the Netherlands