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                                       Details for article 2 of 29 found articles
 
 
  A time-of-flight atom-probe field-ion microscope for the study of defects in metals
 
 
Title: A time-of-flight atom-probe field-ion microscope for the study of defects in metals
Author: Hall, Thomas M.
Wagner, Alfred
Berger, Arnold S.
Seidman, David N.
Appeared in: Scripta metallurgica
Paging: Volume 10 (1976) nr. 5 pages 4 p.
Year: 1976
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 29 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands