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                                       Details for article 58 of 91 found articles
 
 
  193 nm immersion photodetector with an ultra-high EQE of 83.7%
 
 
Title: 193 nm immersion photodetector with an ultra-high EQE of 83.7%
Author: Lin, Zhuogeng
Wang, Zhao
Zhang, Naiji
Zhu, Siqi
Zheng, Wei
Appeared in: Nano today
Paging: Volume 56 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 58 of 91 found articles
 
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