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Journal description
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Details for article 9 of 17 found articles
| Title: |
Mapping and analysis of microplasticity in tensile-deformed double-notched silicon crystals by computer-aided X-ray double-crystal diffractometry |
| Author: |
Liu, H.Y. Mayo, W.E. Weissmann, S. |
| Appeared in: |
Materials science and engineering |
| Paging: | Volume 63 (1984) nr. 1 pages 10 p. |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 17 found articles
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