|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 18 found articles
| Title: |
Analytical characterization of SnO2 thin films |
| Author: |
Advani, G.N. Jordan, A.G. Kluge-Weiss, P. |
| Appeared in: |
Materials science and engineering |
| Paging: | Volume 41 (1979) nr. 1 pages 4 p. |
| Year: |
1979 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 18 found articles
| << previous | next >> |