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Journal description
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Details for article 6 of 22 found articles
| Title: |
Exact anhydride epoxy percentages for electron microscopy embedding (Epon) |
| Author: |
Burke, C.N. Geiselman, C. Wayne |
| Appeared in: |
Journal of ultrastructure research |
| Paging: | Volume 36 (1971) nr. 1-2 pages 8 p. |
| Year: |
1971 |
| Contents: | |
| Publisher: |
Academic Press, Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 22 found articles
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