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Journal description
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Details for article 88 of 154 found articles
| Title: |
Nondestructive investigation of new materials and electronics by microfocal radiography and high resolution X-ray computed tomography |
| Author: | |
| Appeared in: |
NDT international |
| Paging: | Volume 23 (1990) nr. 5 pages 1 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 88 of 154 found articles
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