TOF-OFF: A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions
Title:
TOF-OFF: A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions
Author:
Iwan, B. Andreasson, J. Andrejczuk, A. Abreu, E. Bergh, M. Caleman, C. Nelson, A.J. Bajt, S. Chalupsky, J. Chapman, H.N. Fäustlin, R.R. Hajkova, V. Heimann, P.A. Hjörvarsson, B. Juha, L. Klinger, D. Krzywinski, J. Nagler, B. Pálsson, G.K. Singer, W. Seibert, M.M. Sobierajski, R. Toleikis, S. Tschentscher, T. Vinko, S.M. Lee, R.W. Hajdu, J. Tîmneanu, N.