|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 53 of 63 found articles
| Title: |
Simultaneous interferometric profilometry of surface and thickness of transparent plate using wavelength-modulation |
| Author: |
Kim, Hwan Jeon, Jurim Kim, Sungtae Kim, Yangjin Sugita, Naohiko |
| Appeared in: |
Optik |
| Paging: | Volume 295 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier GmbH |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 53 of 63 found articles
| << previous | next >> |