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Journal description
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Details for article 110 of 129 found articles
| Title: |
Subspace analysis based machine learning method for automated defect detection from fringe patterns |
| Author: |
Pandey, Dhruvam Ramaiah, Jagadesh Ajithaprasad, Sreeprasad Gannavarpu, Rajshekhar |
| Appeared in: |
Optik |
| Paging: | Volume 270 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier GmbH |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 110 of 129 found articles
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