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Journal description
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Details for article 12 of 170 found articles
| Title: |
Analysis on image features for a standard edge by using polarization indirect microscopic system |
| Author: |
Wang, Weize De La Rue, Richard M. Yadav, N.P. Shen, Zhe Cao, Yun Liu, Juan Liu, Xuefeng Xu, Bin |
| Appeared in: |
Optik |
| Paging: | Volume 178 (2019) nr. C pages 363-371 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier GmbH |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 170 found articles
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