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Journal description
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Details for article 64 of 98 found articles
| Title: |
Performance evaluation of patch group-based denoising algorithm using prior learning stage with K-edge imaging technique in CdTe photon counting spectral X-ray system: A Monte Carlo simulation study |
| Author: |
Lee, Youngjin |
| Appeared in: |
Optik |
| Paging: | Volume 174 () nr. C pages 173-177 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier GmbH |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 64 of 98 found articles
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