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Journal description
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Details for article 27 of 34 found articles
| Title: |
Porosity and roughness determination of porous silicon thin films by genetic algorithms |
| Author: |
Ramirez-Gutierrez, C.F. Castaño-Yepes, J.D. Rodriguez-Garcia, M.E. |
| Appeared in: |
Optik |
| Paging: | Volume 173 () nr. C pages 271-278 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier GmbH |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 27 of 34 found articles
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