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                                       Details for article 114 of 126 found articles
 
 
  Study on melting and thermal-stress damage thresholds of silicon induced by long pulsed laser at 0.532, 1.064 and 10.6μm
 
 
Title: Study on melting and thermal-stress damage thresholds of silicon induced by long pulsed laser at 0.532, 1.064 and 10.6μm
Author: Chen, Guibo
Bi, Juan
Appeared in: Optik
Paging: Volume 131 (2017) nr. C pages 917-924
Year: 2017
Contents:
Publisher: Elsevier GmbH
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 114 of 126 found articles
 
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