|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 59 of 149 found articles
| Title: |
Hot-carrier reliability on the optical characteristics of gate stack gate all-around (GSGAA) MOSFET considering quantum mechanical effects |
| Author: |
Madheswaran, M. Ramesh, R. Kannan, K. |
| Appeared in: |
Optik |
| Paging: | Volume 127 (2016) nr. 5 pages 9 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier GmbH |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 59 of 149 found articles
| << previous | next >> |