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Journal description
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Details for article 88 of 110 found articles
| Title: |
Resistance hysteresis loop characteristic analysis of VO2 thin film for high sensitive microbolometer |
| Author: |
Chen, Xiqu Lv, Qiang |
| Appeared in: |
Optik |
| Paging: | Volume 126 (2015) nr. 20 pages 5 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier GmbH |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 88 of 110 found articles
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