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Details for article 1 of 10 found articles
| Title: |
A quick estimation of the LEED pattern size formed by an electrostatic objective lens in LEEM |
| Author: |
Kan, Hung-Chih Phaneuf, R.J. |
| Appeared in: |
Optik |
| Paging: | Volume 112 (2001) nr. 11 pages 4 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Urban & Fischer Verlag |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 10 found articles
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