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Journal description
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Details for article 12 of 15 found articles
| Title: |
Improving the reliability of chip-off forensic analysis of NAND flash memory devices |
| Author: |
Fukami, Aya Ghose, Saugata Luo, Yixin Cai, Yu Mutlu, Onur |
| Appeared in: |
Digital investigation |
| Paging: | Volume 20 (2017) nr. S pages S1-S11 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Aya Fukami, Saugata Ghose, Yixin Luo, Yu Cai, Onur Mutlu |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 15 found articles
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