Incidence of complications for subtotal ionized field ablation of the tonsils
Titel:
Incidence of complications for subtotal ionized field ablation of the tonsils
Auteur:
Lee, Kelvin C. Altenau, Mark M. Barnes, David R. Bernstein, Joseph M. Bikhazi, Nadim B. Brettscheider, Frank A. Caplan, Charles H. Ditkowsky, William A. Ingber, Craig F. Klausner, Lee M. Moghaddassi, Maseih M.
Verschenen in:
Otolaryngology - head and neck surgery
Paginering:
Jaargang 127 (2002) nr. 6 pagina's 8 p.
Jaar:
2002
Inhoud:
Uitgever:
American Academy of Otolarynology - Head and Neck Surgery foundation, Inc.