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Details for article 3 of 7 found articles
| Title: |
Classification of Individual Particles Based on Computer-Controlled Scanning Electron Microscopy Data |
| Author: |
Kim, D. Hopke, P. K. |
| Appeared in: |
Aerosol science and technology |
| Paging: | Volume 9 (1988) nr. 2 pages 133-151 |
| Year: |
1988 |
| Contents: |
Computer-controlled scanning electron microscopy (CCSEM) is known as a powerful tool for measuring individual particle characterization, including various size parameters and the major elemental composition in a short analysis time. To exploit CCSEM as a receptor-modeling technique in a source apportionment study, it is important to define the membership of each particle in a well-defined particle class. Various clustering methods were examined to obtain possible members of homogeneous particle classes. An expert system was then used to build a universal classification rule based on examples of the homogeneous particle classes. These methods were extensively explored and tested using data from a study of El Paso, TX. |
| Publisher: |
Taylor & Francis |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 7 found articles
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