Single Particle Characterization by Time-of-Flight Mass Spectrometry
Titel:
Single Particle Characterization by Time-of-Flight Mass Spectrometry
Auteur:
Reents, W. D. Downey, S. W. Emerson, A. B. Mujsce, A. M. Muller, A. J. Siconolfi, D. J. Sinclair, J. D. Swanson, A. G.
Verschenen in:
Aerosol science and technology
Paginering:
Jaargang 23 (1995) nr. 3 pagina's 263-270
Jaar:
1995
Inhoud:
We have built a particle analyzer capable of real-time detection and characterization of individual particles. Particle analysis is accomplished by pulsed laser ablation of a particle followed by time-of-flight mass spectrometry of the resulting atomic and molecular ions. The detected ions are characteristic of a particle's molecular composition. Particles of different sizes (0.02-10 μm) and compositions (ammonium sulfate, silica, rubidium nitrate, and cesium nitrate) have been detected and characterized. Even refractory materials, e.g. silica, are easily detected.