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Journal description
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Details for article 25 of 69 found articles
| Title: |
An inverse-distance weighting genetic algorithm for optimizing the wafer exposure pattern for enhancing OWE for smart manufacturing |
| Author: |
Wang, Hung-Kai Chien, Chen-Fu |
| Appeared in: |
Applied soft computing |
| Paging: | Volume 94 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 69 found articles
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