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                                       Details for article 39 of 51 found articles
 
 
  Optimal scale Gaussian process regression model in Insulated Gate Bipolar Transistor remaining life prediction
 
 
Title: Optimal scale Gaussian process regression model in Insulated Gate Bipolar Transistor remaining life prediction
Author: Li, Ling-Ling
Zhang, Xin-Bao
Tseng, Ming-Lang
Zhou, Ya-Tong
Appeared in: Applied soft computing
Paging: Volume 78 (2019) nr. C pages 261-273
Year: 2019
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 39 of 51 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands