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Journal description
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Details for article 76 of 76 found articles
| Title: |
X-ray image analysis for explosive circuit detection using deep learning algorithms |
| Author: |
Seyfi, Gokhan Yilmaz, Merve Esme, Engin Kiran, Mustafa Servet |
| Appeared in: |
Applied soft computing |
| Paging: | Volume 151 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 76 of 76 found articles
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