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                                       Details for article 20 of 69 found articles
 
 
  Defect Characterization Through Automated Laser Track Trace Identification in SLM Processes Using Laser Profilometer Data
 
 
Title: Defect Characterization Through Automated Laser Track Trace Identification in SLM Processes Using Laser Profilometer Data
Author: Baucher, Brandon
Chaudhary, Anil B.
Babu, Sudarsanam S.
Chakraborty, Subhadeep
Appeared in: Journal of materials engineering and performance
Paging: Volume 28 (2019) nr. 2 pages 717-727
Year: 2019
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 20 of 69 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands