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Journal description
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Details for article 29 of 87 found articles
| Title: |
Etude par microscopie electronique a balayage de l'endommagement par fatigue du cuivre apres implantation de divers elements (de He à Xe) |
| Author: |
Mendez, J. Violan, P. Fayoux, C. |
| Appeared in: |
Nuclear instruments and methods in physics research |
| Paging: | Volume 209-210 (1983) nr. P2 pages 6 p. |
| Year: |
1983 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 87 found articles
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