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                                       Details for article 268 of 871 found articles
 
 
  Dependence of X-ray yields on different parameters for light element matrices in thick target PIXE and use of standards for calibration in such analysis
 
 
Title: Dependence of X-ray yields on different parameters for light element matrices in thick target PIXE and use of standards for calibration in such analysis
Author: Khaliquzzaman, M.
Lam, S.T.
Sheppard, D.M.
Stephens-Newsham, L.G.
Appeared in: Nuclear instruments and methods in physics research
Paging: Volume 216 (1983) nr. 3 pages 8 p.
Year: 1983
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 268 of 871 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands