|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 622 of 871 found articles
| Title: |
Proton-proton scattering as a tool for hydrogen profiling in thin films for semiconductor technology |
| Author: |
Paduschek, P. Eichinger, P. |
| Appeared in: |
Nuclear instruments and methods in physics research |
| Paging: | Volume 191 (1981) nr. 1-3 pages 5 p. |
| Year: |
1981 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 622 of 871 found articles
| << previous | next >> |