|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 39 of 73 found articles
| Title: |
High-resolution Rutherford backscattering spectrometry and the analysis of very thin silicon nitride layers |
| Author: |
Tamminga, Y. Willemsen, M.F.C. Habraken, F.H.P.M. Kuiper, A.E.T. |
| Appeared in: |
Nuclear instruments and methods in physics research |
| Paging: | Volume 200 (1982) nr. 2-3 pages 6 p. |
| Year: |
1982 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 73 found articles
| << previous | next >> |