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                                       Details for article 59 of 127 found articles
 
 
  Ion multiple scattering: A tool for studying the thickness topography of self-supporting targets
 
 
Title: Ion multiple scattering: A tool for studying the thickness topography of self-supporting targets
Author: Schmaus, D.
L'Hoir, A.
Cohen, C.
Appeared in: Nuclear instruments and methods in physics research
Paging: Volume 194 (1982) nr. 1-3 pages 5 p.
Year: 1982
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 59 of 127 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands