|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 258 of 806 found articles
| Title: |
Depth profiling and diffusion of 22Ne implanted in tantalum by (p, γ) resonance broadening |
| Author: |
Da Silva, M.F. Melo, A.A. Freitag, K. Soares, J.C. |
| Appeared in: |
Nuclear instruments and methods in physics research |
| Paging: | Volume 209-210 (1983) nr. P2 pages 5 p. |
| Year: |
1983 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 258 of 806 found articles
| << previous | next >> |