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Journal description
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Details for article 7 of 54 found articles
| Title: |
A structural study of the thermally oxidized Si(001) wafer by X-ray CTR scattering |
| Author: |
Iida, Y. Shimura, T. Harada, J. Samata, S. Matsushita, Y. |
| Appeared in: |
Surface science letters |
| Paging: | Volume 258 (1991) nr. 1-3 pages 1 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 54 found articles
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