|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 11 of 23 found articles
| Title: |
Low energy electron diffraction and X-ray photoelectron diffraction study of the Cs/Si(001) surface: dependence on Cs coverage |
| Author: |
Abukawa, T. Okane, T. Kono, S. |
| Appeared in: |
Surface science letters |
| Paging: | Volume 256 (1991) nr. 3 pages 1 p. |
| Year: |
1991 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 23 found articles
| << previous | next >> |